- scanning laser analysis
- анализ сканирующим лазером
Англо-український і українсько-англійський словник з аналітичної хімії. — Севастополь: «Вебер». В.В. Рафалюк, О.М. Ловягін . 2002.
scanning laser analysis
Смотреть что такое "scanning laser analysis" в других словарях:
Scanning laser ophthalmoscopy — Retinal image of a left eye via Optos Optomap. Scanning laser ophthalmoscopy (SLO) is a method of examination of the eye. It uses the technique of confocal laser scanning microscopy for diagnostic imaging of retina or cornea of the human eye. As… … Wikipedia
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Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F … Wikipédia en Français
Laser scanning at Stonehenge — The laser scanning at Stonehenge of the Bronze Age dagger and axes inscribed on the sarsens there was undertaken in 2003 by a team from Wessex Archaeology and [http://www.archaeoptics.co.uk/ Archaeoptics] . They used 3D laser scanning… … Wikipedia
Laser Voltage Prober — The Laser Voltage Probe (LVP) is a laser based voltage and timing waveform acquisition system which is used to perform failure analysis on flip chip integrated circuits. The device to be analyzed is de encapsulated in order to expose the silicon… … Wikipedia
Confocal laser scanning microscopy — (CLSM or LSCM) is a technique for obtaining high resolution optical images with depth selectivity.[1] The key feature of confocal microscopy is its ability to acquire in focus images from selected depths, a process known as optical sectioning.… … Wikipedia
Continuous Scan Laser Doppler Vibrometry (CSLDV) — is a method of using a Laser Doppler Vibrometer (LDV) in which the laser beam is swept across the surface of a test subject to capture the motion of a surface at many points simultaneously. This is different from scanning laser vibrometry (SLDV)… … Wikipedia
Thermal laser stimulation — represents a class of defect imaging techniques which employ a laser to produce a thermal variation in a semiconductor device. [Harvnb|Beaudoin|Desplats|Perdue|Boit|2004] This technique may be used for semiconductor failure analysis. There are… … Wikipedia
